Generation of Low Power Test Set by Merging Functional Broadside Test Based Skewed Load Test Cubes
نویسنده
چکیده
Low power test set is generated by merging of the skewed load test cubes that are extracted from the functional broadside tests. The use of functional broadside tests ensures that switching activity of the extracted tests does not exceed that possible during functional operation of the circuit. As the switching activity is prevented from exceeding the switching activity that the circuit is designed for, the power during the application of tests also does not exceed that possible during functional operation of the circuit. The test cubes which are extracted from functional broadside tests preserve the functional operation conditions and the merging of these test cubes helps in the test compaction and thereby increasing the fault coverage.
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